多功能扫描探针显微镜

多功能扫描探针显微镜

价格： $45000

品牌：Microtestmachines

货号：Multifunctional scanning probe microscope NT-206

收藏

产品详情

规格 ：1台

Measurement modes:
 
Motion patterns at the measurements:
- area (matrix); 
- line; 
- single point.
  1. Contact static AFM
  2. Lateral force microscopy /with contact static AFM/
  3. Non-contact dynamic AFM
  4. Intermittent contact AFM (similar to Tapping Mode®)
  5. Phase contrast imaging /with intermittent contact AFM/
  6. Two-pass mode (for static and dynamic AFM)
  7. Two-pass mode with varying separation (for static and dynamic AFM) /Original technique!/
  8. Multicycle scanning (for static and dynamic AFM) /Original technique!/
  9. Multilayer scanning with varying load (for static and dynamic AFM) /Original technique!/
  10. Electrostatic force microscopy (two-pass technique) , **
  11. Current mode , **
  12. Magnetic force microscopy (two-pass technique) *, **
  13. Static force spectroscopy (with calculation of quantitative parameters, surface energy and elastic modulus in the measurement point)
  14. Dynamic force spectroscopy
  15. Dynamic frequency force spectroscopy /Original technique!/
  16. Nanoindentation 
  17. Nanoscratching 
  18. Linear nanowear 
  19. Nanolithography (with control of <i> load, <ii> depth and <iii> bias voltage) 
  20. Microtribometry  /Original technique!/
  21. Microadhesiometry  /Original technique!/
  22. Shear-force microtribometry  /Original technique!/
  23. Temperature-dependent measurements (under all above modes) 
Note. 
* -  or rig required
** - Specialized probes required
Scan field area: from 5x5 micron up to 50x40 microns
Maximum range of measured heights: from 2 to 4 micron
Lateral resolution (plane XY): 1–5 nm (depending on sample hardness)
Vertical resolution (direction Z): 0.1–0.5 nm (depending on sample hardness)
Scanning matrix: Up to 1024x1024 points
Scan rate: 40–250 points per second in X-Y plane
Nonlinearity correction : A software nonlinearity correction provided
Minimum scanning step: 0.3 nm
Scanning scheme: The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe.
Scanner type: A piezoceramic tube.
Cantilevers (probes): Commercial AFM cantilevers of 3.4x1.6x0.4 mm. 
Recommended are probes from  or . Checked for operation with probes by  and 
Cantilever deflection detection system: Laser beam scheme with four-quadrant position-sensitive photodetector
Sample size: Up to 30x30x8 mm (w–d–h); extending allows measurement of samples with height up to 35 mm
High voltage amplifier output: +190 V
ADC: 16 bit
Operation environment: Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70%
Range of automated movement of measuring head: 10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring
Overall dimensions: Scanning unit: 185x185x290 mm
Control electronic unit: 195x470x210 mm
Field of view of embedded videosystem: 1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps.
Vibration isolation: Additional antivibration table is recommended
Host computer: Not less than: Celeron® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows® XP SP1, 2 USB port.
Recommended:  Core i5 or equivalent, RAM 2 GB, HDD 320 GB, VRAM 1 GB, monitor 1600x1200x32 bit, Windows® XP SP2 or higher, 2 free USB port.
Software: Special  and the AFM image processing package  /  are included.

北京伯英科技有限公司

未合作商家
咨询商家

截图后
用微信扫描二维码快速询价

微信二维码询价

购买咨询

换一个